Keysight i3070
Keysight i3070 is a product which more than 40 years of continuous In-Circuit Test Innovation, it’s No.1 market share, more than 10,000 systems deployed globally.
- 作为业内备受赞誉的Keysight i3070电路测试设备,已经行销超过40年,总数超过10,000台的安装量,是市场上绝对的市占率第一的产品
Item | Keysight i3070S6 |
Maximum channels | 1152 |
Maximum nodes | 5184 |
Pin Card | HybridPlus double density |
Driver/Receiver Mux ratio | 9:2 multiplexing |
Vector application rate | 6MPs,12MPs,20MPs |
Logic level | -3.5V to 5V(Per Digital Channel pin programmable) |
Logic threshold | Dual threshold |
Slew rate | 25V/us to 275V/us |
Digital driver/receiver offset | -30n to 100n |
Operating system | windows 10 |
Test generation toolset | Board Consultant/fixture consultant/test consultant |
Board/fixture graphics display | Board Consultant/fixture consultant/test consultant |
Circuit analysis | Automatic(IPG)with Monte carlo Simulation |
Probe pin locator | Interactive probe/pin locator with guided probed |
Runtime yield display | Real time FPY(First Pass Yield) display at runtime |
Probe/fixture maintenance tools | Worse probe reporting(Reports real time fixture probe number that fails frequently) |
Analog unpowered debug interface | Graphical user interface in spread sheet format |
Digital/Analog powered debug interface | Push-button Debug |
AutoDebug | AutoDebug on Analog unpowered tests, Testjet and VTEP v2.0 (VTEP, iVTEP and NPM) |
Modular construction for flexibility/scalability | (1 to 4) Standard |
Dual-well construction for maximum throughput | Standard |
Failure message printer | Yes |
Vacuum solenoids | Built-in standard |
Analog unpowered measurement | 2,4,6 wire measurement |
Backdriving current | 750mA |
Backdriving test program setup | Automatic by logic family |
Overvoltage protection | Yes |
Capacitor discharge protection | Yes |
Arbitrary waveform generator | Yes |
Fixture types supported | Short wire,NoWire,Long wire |
Repeatability | Excellent |
Transportability | Excellent |
Temperature compensation | AutoAdjust@Every 5 degrees celsius temperature drift/1000Hrs |
Open/short testing | Automatic IPG |
Analog testing | Yes |
Vector programming | VCL and PCF |
Vectorless testing | VTEP V2.0 and TestJet |
Disabling analysis | Automatic(IPG) |
Digital test pattern generator | Yes |
Frequency measurement | 60Mhz(Beyond 60Mhz measurement possible using fixure electronics solution) |
Multilevel disable(digital isolation) | Yes |
High-voltage testing capability | 100V |
Low-voltage testing capability | No limit |
Number of analog guarding points | Unlimited |
Worst probe report | Yes |
First pass yield report | Yes |
Component-level coverage report | Yes |
Limited access tools | Yes |
Flash 70 device programming | Yes |
Polarity check software | Yes |
ICT Boundary Scan | Yes |
PanelTest for panelized PCBAS | Yes |
No-wire fixture development software | Yes |
Multiple board versions software | Yes |
Dual-well sharing | Yes |
Throughput multiplier | Yes |
SPC quality tool | Push-button Q-stats |
SHORT WIRE FIXTURE
-短线夹具
VECTORLESS TEST(Nano-VTEP)
-最新的Nano-Vtep技术
TRUE PARALLEL TESTING
-真正的并行测试技术
BT-Basic DLL Integration
-执行DLL动态数据库
Power Monitoring Circuit
-电源监控
Fixture Power Supply
-夹具电源
DC test method for large capacitor testing
-DC测试模式测试大电容(1000uF to 30mF)
GUI Ease of use
-图像化界面、容易操作
AutoOptimizer
-自动优化测试程序
AutoDebug
-自动调试
IEEE1149.1,1149.6 Standard Boundary Scan Testing
-标准的1149.1,1149.6边界扫描测试