Keysight i3070

Keysight i3070 is a product which more than 40 years of continuous In-Circuit Test Innovation, it’s No.1 market share, more than 10,000 systems deployed globally. 

- 作为业内备受赞誉的Keysight i3070电路测试设备,已经行销超过40年,总数超过10,000台的安装量,是市场上绝对的市占率第一的产品

Item Keysight   i3070S6
Maximum   channels 1152
Maximum nodes 5184
Pin Card HybridPlus double   density
Driver/Receiver   Mux ratio 9:2 multiplexing
Vector   application rate 6MPs,12MPs,20MPs
Logic level -3.5V to 5V(Per   Digital Channel pin programmable)
Logic   threshold Dual threshold
Slew rate 25V/us to 275V/us
Digital   driver/receiver offset -30n to 100n
Operating   system windows 10
Test   generation toolset Board   Consultant/fixture consultant/test consultant
Board/fixture   graphics display Board   Consultant/fixture consultant/test consultant
Circuit   analysis Automatic(IPG)with   Monte carlo Simulation
Probe pin   locator Interactive probe/pin   locator with guided probed
Runtime yield   display Real time FPY(First   Pass Yield) display at runtime
Probe/fixture   maintenance tools Worse probe   reporting(Reports real time fixture probe number that fails frequently)
Analog   unpowered debug interface Graphical user   interface in spread sheet format
Digital/Analog   powered debug interface Push-button Debug
AutoDebug AutoDebug   on Analog unpowered tests, Testjet and VTEP v2.0
    (VTEP, iVTEP and NPM)
Modular   construction for flexibility/scalability (1 to 4) Standard
Dual-well   construction for maximum throughput Standard
Failure   message printer Yes
Vacuum   solenoids Built-in standard
Analog   unpowered measurement 2,4,6 wire   measurement
Backdriving   current 750mA
Backdriving   test program setup Automatic by logic   family
Overvoltage   protection Yes
Capacitor   discharge protection Yes
Arbitrary   waveform generator Yes
Fixture types   supported Short   wire,NoWire,Long wire
Repeatability Excellent
Transportability Excellent
Temperature   compensation AutoAdjust@Every 5 degrees celsius   temperature drift/1000Hrs
Open/short   testing Automatic IPG
Analog testing Yes
Vector   programming VCL and PCF
Vectorless   testing VTEP V2.0 and TestJet
Disabling   analysis Automatic(IPG)
Digital test   pattern generator Yes
Frequency   measurement 60Mhz(Beyond 60Mhz   measurement possible using fixure electronics solution)
Multilevel   disable(digital isolation) Yes
High-voltage   testing capability 100V
Low-voltage   testing capability No limit
Number of   analog guarding points Unlimited
Worst probe   report Yes
First pass   yield report Yes
Component-level   coverage report Yes
Limited access   tools Yes
Flash 70   device programming Yes
Polarity check   software Yes
ICT Boundary   Scan Yes
PanelTest for   panelized PCBAS Yes
No-wire   fixture development software Yes
Multiple board   versions software Yes
Dual-well   sharing Yes
Throughput   multiplier Yes
SPC quality   tool Push-button Q-stats












BT-Basic DLL Integration



Power Monitoring Circuit



Fixture Power Supply



DC test method for large capacitor testing

-DC测试模式测试大电容(1000uF to 30mF)


GUI Ease of use









IEEE1149.1,1149.6 Standard Boundary Scan Testing