Wi8 WAFER INSPECTION SYSTEM Wi8 晶圆视检系统

ViTrox Wafer Vision Inspection Handler offers advanced solution for 2D  surface defect inspections and metrology.

伟特科技的晶圆检测设备使用先进技术，提供2D表面缺陷检测与尺寸 测量。

Multiple handling mechanisms to support different wafer forms  including raw wafer, hoop ring, and frame wafer range from 100mm  (4”) to 300mm (12”).

多种机械臂设计，可传送各种晶圆类型，包括4寸到12寸的裸晶，子母环 和铁环。

BENEFITS 优势

• Replace conventional human visual inspection. 取代传统人工目检。

• Provide inspection customization to fit future inspection needs. 高度客制化的检测选项以迎合未来的检测需求。 

• Provide repeatability and reproducibility inspection results. 重复性和再现性的检测结果，降低检测误差。

• Customize inspection algorithm. 高度客制化的检测运算。

• Maximize production throughput and yield. ******化产量和良率。

•Targeting the market most demanding applications, including: MEMS, RF, CMOS Image Sensor, Memory.   可满足晶圆的高需求应用，包括MEMS，RF，CMOS成像传感器和存储器。

ADVANCED & AUTOMATED SOLUTION 先进与自动化 解决方案

The advanced and automated solution enhances productivity, quality and  profitability through robust inspection algorithm and sophisticated hardware  design.

通过强稳的检测运算和尖端的硬体设计，此设备大大提高生产力，品质与获利率。

Our Offline Verifier (OV) offers real-time fail result validation by retrieving marginal  defect unit to maximize production yield.

离线复检站提供实时缺陷检测认证，通过检测微小的缺陷，******化产量